INGUN test probes are now available at TME
INGUN test probes are now available at TMEDate of publication: 29-03-2023 🕒 3 min read
Nowadays, mass production of electronic circuits is almost a fully automated process. This also applies to quality control, which essentially includes ICT solutions (In-Circuit Tests). Make sure you browse through the accessories for automatic testing offered by INGUN, which are now available at TME.
In-circuit testing, also known as ICT, is used to check the continuity of connections in PCB components (including paths and solder joints) by way of connecting a series of probes to the circuit. Another, more complex solution is functional testing, also known as FCT, in which components are powered up and then their parameters are measured. In both technologies, in order to establish a connection between a test system and a PCB, test probes are used. They are compact, spring-loaded probes designed for automated work. Apart from this, they are also used for microcontroller programming (ISP, in-system programming). In order to function properly and to avoid frequent replacement, probes must be:
- durable (as they are frequently and regularly used)
- resistant to microscopic contamination (such as flux residue)
- precise (a small deviation from standard parameters may lead to a faulty reading, or even damage the circuit)
INGUN products feature all those characteristics. The German company has been manufacturing test probes since 1971. The brand is well-known in Europe as well as in the USA, India, China and South America. We are pleased to inform you that INGUN’s products are now available at TME.
Currently, there are over 300 INGUN products available at TME – including test probes, dedicated sockets, as well as specialist tools. The test probes come in a range of tip diameters from 0.2 mm to 4 mm, with a stroke of 2.2 mm to 9.3 mm. They feature very low electrical resistance (only 20 mΩ in most products) and are made from steel or beryllium copper (an alloy which guarantees high durability while maintaining excellent electrical and thermal conductivity). The probes feature a current load capacity of up to 8 A (depending on the model), which means that they can be used for verifying parameters as well as providing power to circuits and stress testing. What is more, various tip shapes are compatible with different test points and components used in ICT solutions.
